NetUSB II™
Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires a controller with high performance specifications and diverse features.
The NetUSB II is a high-performance, multi-feature boundary-scan controller for multi-TAP and concurrent JTAG test and in-system programming. Featuring dual-interface USB and LAN support with four or eight independent and configurable Test Access Ports (TAPs), direct serial programming capability and voltage sense support, the NetUSB II fits a multitude of boundary-scan applications.
Features
– High-performance JTAG controller with I2C and SPI interfaces
– Concurrent (gang) testing and In-System Programming on up to eight UUTs for high volume test
– Four or eight TAP connections for UUT designs with multiple scan chains
– Configurable TAP pinout to accommodate custom JTAG connections
– User-programmable JTAG TCK rate up to 100 MHz on each TAP
– Independently configurable output voltage and input voltage threshold
– Adjustable signal delay compensation to maximize achievable clock rate
– Up to 16 total analog voltage measurement channels; two per TAP
– Dual interface with high-speed USB and gigabit Ethernet
– Supports Microsoft Windows and Linux operating systems
The Corelis NetUSB II is fully compliant with the IEEE Standard 1149.1 for test access. The standalone unit connects between the host PC through a high-speed USB port or Ethernet connection and up to four (4-TAP version) or eight (8- TAP version) TAP connectors on any JTAG-based target system. Support for concurrent (Gang) test execution and in-system programming, voltage sense capabilities, configurable pinout, and integrated serial interfaces on each TAP connector make the NetUSB II ideal for multi-TAP and high-volume JTAG and serial bus-programming integration.
