ScanExpress Runner™
Automated testing is essential and boundary-scan is a critical component; no other structural test system provides the same value.
When down to the wire, your boundary-scan test system needs to be built both for ease-of-use and reliability; a robust and powerful mechanism to ensure that no matter the state of production, all boundary-scan tests can be quickly and faithfully executed to maintain forward momentum.
ScanExpress Runner™ is a fully featured JTAG test executive; a modern software application that provides the capabilities and options necessary to ensure a smooth and complete testing process offering one-touch execution of test sequences and interface support for all major test platforms.
Features
– Built-in test sequencer that automatically and dynamically executes independent test steps
– Intelligent fault detection and isolation to the net and pin level
– Truth Table Diagnostics with pattern and waveform views
– Integrated test debugger with breakpoints, looping, and single-stepping
– User-programmable general purpose input/output (GPIO) signal control
– Integrated test debugger with breakpoints, looping, and single-stepping
– Built-in analytics data collection with chart and graph display
– In-System-Programming (ISP) of CPLDs, flash, and serial EEPROM devices
– Executes JTAG Embedded Test (JET) steps for extended test coverage and embedded functional testing
– Interfaces with LabVIEW, LabWindows/CVI, Keysight VEE, Visual Basic, and other third-party test executives
– Compatible with the complete Corelis ScanExpress family of products
The ScanExpress Runner™ test executive enables execution of IEEE-1149.1 & IEEE-1149.6 (JTAG) boundary-scan tests with an easy-to-use graphical user interface (GUI) and advanced test execution features. Runner comes standard with Basic Diagnostic (BDO) functionality and can be enhanced with the optional Advanced Diagnostics (ADO) module for detailed pin and net level diagnostics.
