ScanExpress TPG™
To deliver a product meeting the highest standards of quality and reliability, design engineers and test engineers alike must maintain test capabilities throughout the entire product life cycle, from prototype to manufacturing. Automation in test generation is essential to ensure that tests keep up with the rapid development of modern products.
The ScanExpress TPG™ Intelligent Test Pattern Generator Software provides a highly advanced, automated boundary-scan test design environment—perfect for quick and efficient creation of complete boundary-scan tests for all IEEE-1149.1 and IEEE-1149.6 compliant circuit boards.
Features
– An intuitive wizard guides the user through the construction of complete test procedures
– Automatically generates test patterns for infrastructure, interconnect, memories, FIFOs, clusters, and resistors using proven, mature boundary-scan test algorithms
– Test management functions for creating project revisions and test variations within a single parent test project
– Detects and supports industry standard CAD netlist formats
– Identifies the boundary-scan chain order and draws a graphical representation of the boundary-scan chain
– Finds and classifies all resistors and resistor packs as either pull-up, pull-down, series, differential termination, or non-testable resistor types
– Complex script language with integrated debugging environment assists in writing custom boundary-scan test steps
– Constructs test plans for integration into the ScanExpress Runner™ test execution sequencer (sold separately)
– Assembles detailed fault coverage analysis reports for use with the ScanExpress DFT Analyzer™ (sold separately)
– Single Integrated Development Environment (IDE) for all JTAG applications simplifying test development, execution, and analysis
– Complies with IEEE standards 1149.1 and 1149.6
